Digital Circuit Testing and Testability

Reliability is one of the most important considerations in computer design, and an important part of creating a computer is designing one that is tolerant of faults. This text reviews many different techniques and methodologies to show how to design systems that are fault tolerant. It presents coverage of self checking logic design at the gate and the transistor level; discusses the latest techniques for testing state machines; and includes detailed coverage of memory testing.

• Author
• Parag K. Lala

• Format
• hardcover

• Pages
• 199

• Publisher
• Academic Press

• Language
• english

• ISBN
• 9780124343306

• Release date
• 1997